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A Study of Excited State Atoms in Cold Atom Traps and a test of the Reif Model to Determine Trap Depth.

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dc.contributor.author Evetts, Nathan
dc.date.accessioned 2011-08-23T20:41:43Z
dc.date.available 2011-08-23T20:41:43Z
dc.date.issued 2011
dc.identifier.citation Evetts, Nathan. 2011. A Study of Excited State Atoms in Cold Atom Traps and a test of the Reif Model to Determine Trap Depth. Undergraduate Honours Thesis. Department of Physics and Astronomy. University of British Columbia. en_US
dc.identifier.uri http://hdl.handle.net/2429/36858
dc.description.abstract The motivation, theory and applications of atomic traps are briefly reviewed before delving into the primary motivation for the research: the disagreement between theory and experiment for the calculation of trap loss rate constants (< σv >) for Rubidium Magneto-Optical Traps. We use a pure magnetic trap to calibrate for the density of background Rubidium in our system while varying this density and measuring the loss and loading rates for multiple magnetic traps for which the trap depth has been measured previously. This variation of density allows us to infer < σv >, a quantity whose behaviour we attempt to explain in relation to the the excited state fraction of the trapped atoms. We find a strong correlation between the excited state fraction and the loss rate constant which we are, unfortunately, unable to quantify due to data quality issues. In addition to this study, experimental evidence for the confirmation of the Reif Model is provided as well as a new method (based on this model) for measuring the depth of a magneto-optical trap. en_US
dc.language.iso eng en_US
dc.relation.ispartofseries Undergraduate Honours Theses en_US
dc.title A Study of Excited State Atoms in Cold Atom Traps and a test of the Reif Model to Determine Trap Depth. en_US
dc.type text en_US
dc.type.text thesis/dissertation en_US
dc.description.affiliation Physics and Astronomy, Dept of en_US
dc.description.reviewstatus Unreviewed en_US
dc.rights.copyright Evetts, Nathan en_US
dc.description.scholarlevel Undergraduate en_US


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