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On power-supply current testing of mixed-signal phase-locked-loops

University of British Columbia

Due to rapid advances in the speed and complexity of VLSI circuits, analog and mixed-signal circuits are going through a resurgence. Today, the state-of-the-art of the analog and mixed-signal integrated circuit testing is to use application-specific test techniques for individual modules. Efforts have been made to develop simple, generic test techniques to tackle this problem. Current-mode testing is one such approach. The effectiveness of power supply current testing for digital IC's has led researchers to explore the possibility of extending this concept to testing analog blocks of mixed-signal ICs. Unfortunately, current-mode test techniques developed for commonly-studied analog blocks, such as op-amps and filters, do not apply to non-linear blocks such as phase-locked loops. This thesis focuses on investigating the effectiveness of using power supply current monitoring techniques to detect potential faults in phase-locked loop (PLL) circuits. The decision for declaring a circuit as fault free, or- faulty, is made by defining a simple threshold which takes into account the tolerances on the circuit parameters and process variations.

Thesis/Dissertation

application/pdf

2009-03-24

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http://hdl.handle.net/2429/6385

Electrical and Computer Engineering

University of British Columbia

UBCV

DSpace